Knowing the safety and reliability of parts and assets you produce requires highly precise measurements throughout the manufacturing process. Waygate Technologies' advanced high precision industrial Computed Tomography metrology systems are able to measure even hidden internal surfaces with a precision of just a few micrometers, capturing high-precision geometries with a single scan.
Waygate Technologies的CT扫描仪可提供有关内部几何偏差的高分辨率见解，即使是最新的坐标测量机（CMM）。我们的解决方案从小零件扫描仪到工业，生产线和基于龙门的机器人扫描仪，都可以提供您需要的任何检查指标。
Our solutions offer you access to the right tools to complete truly automated calibrations and system validation tests, anytime, without the need to call a technician. Increase efficiency with 3x faster and easier system calibrations using our patentedRuby|plate phantoms and True|position technology。We also make upgrades easy, with Metrology 2.0 optionally available now for the Phoenix V|tome|x M microCT scanner. Metrology upgrades conforming to VDI/VDE standard 2630-1.3 are also available for Phoenix V|tome|x C450 and V|tome|x L300 / L450 systems for applications requiring larger scan volumes or the use of minifocus or the combination of minifocus and microfocus.
Proprietary technology such as Waygate Technologies’ Scatter|correct enables scanning of scattering materials with the same artifact-free precision like fan beam CT, but with many times faster cone beam CT. Plus, reduce downtime with 3x faster and easier system calibrations using our patentedRuby|plate phantoms。
Discover Our Products
True |位置和红宝石|板块
Used for compensation of residual system mechanical uncertainties included in the Metrology 2.0 package, True|position expands the two measurement positions with VDI 2630-specified accuracy to all positions for improved 3D metrology workflows and precision. This can be verified with Waygate Technologies’ patented Ruby|plate calibration phantom, enabling 3x faster system accuracy verification without any user interaction.
Phoenix V|tome|x M300
The world’s first, highly-flexible microCT scanner designed for 3D metrology and failure analysis with Scatter|correct technology to automatically remove scatter artifacts for higher image quality. In its Metrology|edition configuration, the system allows highest, repeatable VDI 2630-1.3 metrology standard conform precision measurements of SD ≤ (3.8 ± L/100 mm) µm.
Phoenix V | Tome | X L 300
A versatile, large cabinet microfocus system for 3D computed tomography (microCT+ optional nanoCT) and 2D non-destructive X-ray inspection, capable of handling large samples up to 50 kg and up to 500 mm in diameter with an extremely high precision specification of SD ≤ (6.8 ± L/100 mm) µm conform to VDI/VDE 2630-1.3 standard.
